Development of Mathematical Models for Detecting Micron Scale Volumetric Defects in Thin Film Coatings
Gaigals, G., M. Donerblics, and G. Dreifogels. "Development of Mathematical Models for Detecting Micron Scale Volumetric Defects in Thin Film Coatings." Latvian Journal of Physics and Technical Sciences 53.2, 38-47, 2016.
